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KMID : 0381920050350010001
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Korean Journal of Microscopy
2005 Volume.35 No. 1 p.1 ~ p.13
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Artifacts Frequently Encountered in Electron Micrographs
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박창현/Park CH
조강용/엄창섭/Cho KY/Uhm CS
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Abstract
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KEYWORD
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Artifact, Development, Electron micrograph, Observation, Printing, Tissue processing
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FullTexts / Linksout information
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Listed journal information
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